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検索キーワード:(件名: #Optical measurements)
該当件数:10件
Advances in optical form and coordinate metrology / edited by Richard Leach
hbk.. - Bristol : IOP Publishing , 2020
図書
Advances in optical surface texture metrology / edited by Richard Leach
Handbook of optical metrology : principles and applications / edited by Toru Yoshizawa
: hbk.. - Boca Raton, Fla : CRC , c2009
Optical shop testing / edited by Daniel Malacara
3rd ed. - Hoboken, N.J. : Wiley-Interscience , c2007. - (Wiley series in pure and applied optics)
Interferogram analysis for optical testing / Daniel Malacara, Manuel Servín, Zacarias Malacara
: pbk. - 2nd ed. - Boca Raton, FL : Taylor & Francis , 2005. - (Optical engineering ; v. 84)
New York, NY : Marcel Dekker , c1998. - (Optical engineering ; 61)
2nd ed. - New York : Wiley , c1992. - (Wiley series in pure and applied optics)
In-process optical measurements and industrial methods : ECO3 : 14-15 March 1990, the Hague, the Netherlands / H.A. Macleod, Peter Langenbeck, chairs/editors : the congress of EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical Engineering ; cooperating organizations, ANRT--Association Nationale de la Recherche Technique ... [et al.]
Bellingham, Wash., USA : SPIE , c1990. - (Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1266)
In-process optical metrology for precision machining, 31 March-2 April 1987, The Hague, The Netherlands / Peter Langenbeck, chair/editor : organized by, ANRT--Association nationale de la recherche technique, SPIE--the International Society for Optical Engineering ; cooperating sponsors, Comité belge d'optique ... [et al.]
Bellingham, Wash., USA : SPIE , [1987]. - (Proceedings / SPIE -- the International Society for Optical Engineering ; v. 802)
New York : Wiley , c1978. - (Wiley series in pure and applied optics)