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RT Book, Whole SR Print DC OPAC T1 Pattern classification / Richard O. Duda, Peter E. Hart, David G. Stork OT Pattern classification and scene analysis A1 Duda, Richard O. A1 Hart, Peter E. A1 Stork, David G. YR 2001 FD c2001 SP xx, 654 p. K1 Pattern recognition systems K1 Statistical decision ED 2nd ed PB Wiley PP New York ; Chichester SN 9780471056690 LA English (英語) CL NDC8:007.1 CL LCC:Q327 CL DC21:006.4 NO Rev. ed. of: Pattern classification and scene analysis / R.O. Duda and P.E. Hart (Wiley-Interscience, c1973) NO "A Wiley-Interscience publication" NO Includes bibliographies and index NO 書誌ID=B000092979; NCID=BA4963402X; LK [OPAC]https://lib.pu-toyama.ac.jp/opac/opac_link/bibid/B000092979 OL 30