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RT Book, Whole SR Print DC OPAC T1 1991 proceedings : Annual Reliability and Maintainability Symposium : Orlando, Florida USA, 1991 January 29-31 A1 Reliability and Maintainability Symposium YR 1991 FD c1991 SP xx, 623, 75 p. PB Institute of Electrical and Electronics Engineers PP New York LA English (英語) NO "IEEE catalog number: 91CH2966-0." NO 書誌ID=B000092035; NCID=BA12359405; LK [OPAC]https://lib.pu-toyama.ac.jp/opac/opac_link/bibid/B000092035 OL 30