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RT Book, Whole SR Print DC OPAC T1 Rapid reliability assessment of VLSICs / A.P. Dorey ... [et al.] A1 Dorey, A. P. YR 1990 FD c1990 SP ix, 202 p. K1 Integrated circuits -- Very large scale integration -- Testing K1 Integrated circuits -- Very large scale integration -- Reliability PB Plenum Press PP New York SN 030643492X LA English (英語) CL LCC:TK7874 CL DC20:621.39/5 NO Includes bibliographical references and index NO 書誌ID=B000086902; NCID=BA12410207; LK [OPAC]https://lib.pu-toyama.ac.jp/opac/opac_link/bibid/B000086902 OL 30