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RT Book, Whole SR Print DC OPAC T1 Digital circuit testing and testability / Parag K. Lala A1 Lala, Parag K., 1948- YR 1997 FD c1997 SP xii, 199 p. K1 Integrated circuits -- Very large scale integration -- Testing K1 Digital integrated circuits -- Testing K1 Integrated circuits -- Fault tolerance PB Academic Press PP San Diego SN 0124343309 LA English (英語) CL LCC:TK7874.75 CL DC20:621.39/5/0287 NO Includes bibliographical references and index NO 書誌ID=B000057609; NCID=BA30378332; LK [OPAC]https://lib.pu-toyama.ac.jp/opac/opac_link/bibid/B000057609 OL 30