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RT Book, Whole SR Print DC OPAC T1 Statistical modeling for computer-aided design of MOS VLSI circuits / Christopher Michael, Mohammed Ismail T2 The Kluwer international series in engineering and computer science A1 Michael, Christopher A1 Ismail, Mohammed YR 1993 FD c1993 SP xvi, 190 p. K1 Metal oxide semiconductors -- Design and construction -- Statistical methods -- Data processing K1 Metal oxide semiconductors -- Mathematical models K1 Integrated circuits -- Very large scale integration -- Design and construction -- Data processing K1 Integrated circuits -- Very large scale integration -- Mathematical models K1 Computer-aided design PB Kluwer Academic Publishers PP Boston SN 079239299X LA English (英語) CL LCC:TK7871.99.M44 CL DC20:621.39/5 NO Includes bibliographical references (p. [179]-187) and index NO 書誌ID=B000049133; NCID=BA20525463; LK [OPAC]https://lib.pu-toyama.ac.jp/opac/opac_link/bibid/B000049133 OL 30