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RT Book, Whole SR Electronic DC OPAC T1 Pattern recognition : a quality of data perspective / by W�adys�aw Homenda, Witold Pedrycz T2 Wiley series on methods and applications in data mining A1 Homenda, W�adys�aw A1 Pedrycz, Witold 1953- YR 2018 FD 2018 SP 1 online resource K1 Pattern recognition systems K1 Pattern perception K1 Data mining K1 Reconnaissance des formes (Informatique) K1 Perception des structures K1 Exploration de donn�ees (Informatique) K1 COMPUTERS -- General K1 Data mining K1 Pattern perception K1 Pattern recognition systems K1 Data Mining K1 Mustererkennung PB John Wiley & Sons PP Hoboken, NJ SN 9781119302858 SN 1119302854 SN 9781119302834 SN 1119302838 SN 9781119302872 SN 1119302870 LA English (英語) CL LCC:TK7882.P3 CL DC23:006.4 NO Includes bibliographical references and index NO Pattern recognition : feature space construction -- Pattern recognition : classifiers -- Classification with rejection problem formulation and an overview -- Evaluating pattern recognition problem -- Recognition with rejection : empirical analysis -- Concepts and notions of information granules -- Information granules : fundamental constructs -- Clustering -- Quality of data : imputation and data balancing NO Print version record and CIP data provided by publisher NO John Wiley and Sons Wiley Online Library: Complete oBooks NO HTTP:URL=https://onlinelibrary.wiley.com/doi/book/10.1002/9781119302872 NO 書誌ID=EB00004487; LK [E Book]https://onlinelibrary.wiley.com/doi/book/10.1002/9781119302872 OL 30