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RT Book, Whole SR Electronic DC OPAC T1 Pattern Recognition Applications and Methods : 10th International Conference, ICPRAM 2021, and 11th International Conference, ICPRAM 2022, Virtual Event, February 4–6, 2021 and February 3–5, 2022, Revised Selected Papers / edited by Maria De Marsico, Gabriella Sanniti di Baja, Ana Fred T2 Lecture Notes in Computer Science. ISSN:16113349 A1 De Marsico, Maria A1 Sanniti di Baja, Gabriella A1 Fred, Ana A1 SpringerLink (Online service) YR 2023 FD 2023 SP XIII, 175 p. 82 illus., 75 illus. in color K1 Pattern recognition systems K1 Machine learning K1 Computer engineering K1 Computer networks K1 Application software K1 Automated Pattern Recognition K1 Machine Learning K1 Computer Engineering and Networks K1 Computer and Information Systems Applications K1 Computer Engineering and Networks ED 1st ed. 2023. PB Springer International Publishing : Imprint: Springer PP Cham SN 9783031245381 LA English (英語) CL LCC:Q337.5 CL LCC:TK7882.P3 CL DC23:006.4 NO Theory and Methods Reduced Precision Research of a GAN Image Generation Use-case -- Constrained Conditional Generative Auto-encoder with Generalized Dilated Networks -- Retinotopic Image Encoding by Samples of Counts -- Gesture Recognition and Multi-Modal Fusion on a New Hand Gesture Dataset -- Adaptive Sampling for Weighted Log-rank Survival Trees Boosting -- Applications Forecasting Overtime Budgets for Naval Fleet Maintenance Facilities using Time-series Analysis during Transient System States -- Exploiting Temporal Coherence to Improve Person Re-identification -- Perusal of Camera Trap Sequences across Locations NO This book contains revised and extended versions of selected papers from the 10th and 11th International Conference on Pattern Recognition, ICPRAM 2021 and 2022, held in February 2021 and 2022. Due to COVID-19 pandemic the conferences were held virtually. Both conferences received in total 204 submissions from which 8 full papers were carefully reviewed and selected for presentation in this volume. The papers span a wide range of investigation as well as development lines, which of course always reflect the last trends of research in the pattern recognition community NO HTTP:URL=https://doi.org/10.1007/978-3-031-24538-1 NO 書誌ID=EB00001681; LK [E Book]https://doi.org/10.1007/978-3-031-24538-1 OL 30