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RT Book, Whole SR Print DC OPAC T1 Failure mechanisms in semiconductor devices / E.A. Amerasekera and D.S. Campbell A1 Amerasekera, E. A. A1 Campbell, D. S. YR 1987 FD c1987 SP xiii, 205 p. K1 Semiconductors -- Failures PB New York : Wiley PP Chichester SN 0471914347 LA English (英語) CL LCC:TK7871.85 CL DC19:621.3815/2 NO Bibliography: p. 179-195 NO Includes indexes NO 書誌ID=B000050270; NCID=BA03704342; LK [OPAC]https://lib.pu-toyama.ac.jp/opac/opac_link/bibid/B000050270 OL 30