OPAC

Yield simulation for integrated circuits / by Duncan Moore Henry Walker
(The Kluwer international series in engineering and computer science ; SECS 33 . VLSI, computer architecture, and digital signal processing)

データ種別	図書
出版者	Boston : Kluwer Academic Publishers
出版年	c1987
本文言語	英語
大きさ	x, 209 p. : ill. ; 25 cm
著者標目	*Walker, Duncan Moore Henry

巻　次	配架場所	請求記号	登録番号	コメント	刷　年	状　態	利用注記	ISBN	予約	請求メモ
	射水-1階-洋書	549.7\|\|W36	100796721						予約		予約

一般注記	Based on author's thesis (Ph. D.) Includes bibliographical references and index
件　名	LCSH:Integrated circuits -- Very large scale integration -- Design and construction -- Mathematical models 全ての件名で検索 LCSH:Integrated circuits -- Very large scale integration -- Design and construction -- Data processing 全ての件名で検索 LCSH:Integrated circuits -- Very large scale integration -- Defects -- Mathematical models 全ての件名で検索 LCSH:Integrated circuits -- Very large scale integration -- Defects -- Data processing 全ての件名で検索 LCSH:Monte Carlo method
分　類	LCC:TK7874 DC19:621.381/73
書誌ID	B000043783
ISBN	0898382440
NCID	BA07139931