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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder
(Image Processing, Computer Vision, Pattern Recognition, and Graphics. ISSN:30049954 ; 4109)

データ種別	電子ブック
版	1st ed. 2006.
出版者	(Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer)
出版年	2006
大きさ	XXI, 939 p : online resource
著者標目	Yeung, Dit-Yan editor Kwok, James T editor Fred, Ana editor Roli, Fabio editor de Ridder, Dick editor SpringerLink (Online service)

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