Lala, Parag K., 1948-
著者名典拠詳細を表示
| 著者の属性 | 個人 |
|---|---|
| 一般注記 | His Fault tolerant and fault testable hardware design, 1985: CIP t.p. (Parag K. Lala, Dept. of Computer Science, Univ. of York) data sheet (b. 1-15-48) LC data base, 4-4-84 (hdg.: Lala, P. K.; usage: P. K. Lala) |
| 生没年等 | 1948- |
| から見よ参照 | Lala, P. K. Lala, P. K. (Parag K.), 1948- |
| コード類 | 典拠ID=AU00057843 NCID=DA02139930 |
| 1 | Digital circuit testing and testability / Parag K. Lala San Diego : Academic Press , c1997 |